Jerome B. Cohen X-ray Diffraction Facility

Cook Hall, 1016
Tel: (847) 491-7810

Facility Director: Michael Bedzyk, MSE
Facility Manager: Jerry Carsello

Visit the X-ray diffraction facility website here.

The primary function is to provide general-purpose x-ray equipment for diffraction and fluorescence studies. The facility can also make accommodations for non-routine experiments such as special attachments for high and low temperatures, vacuum or protective atmospheres, monochromators, special detectors, etc. Examples of current measurements are: powder diffraction, single-crystal diffraction, thin-film reflectivity, thin-film diffraction, crystal truncation rod scattering, small angle scattering, Laue diffraction, wave-length dispersive x-ray fluorescence, x-ray standing waves and high-resolution x-ray diffraction.

EQUIPMENT:

There are presently fourteen experimental x-ray stations available, five of which have rotating anode sources.

1. Rigaku AXT-G Thin-film Diffraction Workstation: A high intensity 18kW copper x-ray source is coupled to a multilayer mirror. The system has selectable x-ray optical configurations suitable for work with single crystal, thin-film or poly-crystalline film samples. Also supported are grazing incidence and in-plane diffraction geometries. Other features are the 5-axis goniometer with several 4-crystal monochrometers that couple to the multilayer mirror.

2. 18kW Rigaku: High-resolution 4-circle diffractometer with Osmic Max-Flux multi-layer mirror, coupled to Si or Ge monochromator, SPEC software control, high-count rate scintillation detector, automated beam attenuator and multi-channel analyzer fluorescence spectroscopy system.

3. 12kW Rigaku: Medium resolution 4-circle diffractometer with SPEC software control and automated beam attenuator.

4. 18kW Rigaku: 2-circle diffractometer with Osmic Max-Flux multi-layer mirror, high-count rate scintillation detector and multi-channel analyzer fluorescence system.

5. Bruker S4: Automated wavelength dispersive x-ray fluorescence (WD-XRF) system.

6. Scintag XDS2000: Automated diffraction system with four-circle pole-figure and residual stress device, thin film diffraction attachment and solid-state detector.

7. Rigaku Dmax: Automated powder diffraction stations featuring Jade Analysis software.

8. PC data analysis workstation: JADE powder diffraction analysis software, CaRine diffraction simulation software, JCPDS powder diffraction database and Laue analysis software.

9. Blake High Resolution tangential goniometer: 5-Bounce high-resolution rocking curve-scan system. Sealed tube x-ray source.

10. Small-angle scattering system: Micro-beam rotating anode, Bruker Hi-Star 2-dimesional detector, elevated temperature attachment and GADDS, software. (q=0.1 Å -1)

11. Rigaku S-MAX 3000 High Brilliance SAXS System (Available Oct 2007) Rotating anode with multilayer mirror, 2-D wire detector, SAXS-GISAXS, WAXS capabilities including high temperature. q(min) = 0.04 Å -1

OTHER AVAILABLE EQUIPMENT:

1. A variety of x-ray anode targets and source sizes to accommodate the four high intensity rotating anode generators and the nine sealed tube x-ray generators.

2. Various Si, Ge, Graphite and LiF crystals and multi-layer mirrors are available for incident or diffracted beam monochromators.

3. Environmental chambers for vacuum, atmosphere, low temperature (>2 K) or high temperature (< 2300 K) operation.

4. Six solid-state detectors with associated electronics, SCA's and MCA's.

5. Three gas-filled 1-dimesional linear position sensitive detectors.

6. Variety of film cameras: Debye-Scherrer, Laue, rotating crystal, cylindrical, topographic, Buerger precession, Guinier, high pressure and darkroom facilities.

COMPUTERS and SOFTWARE :

All of the x-ray stations operate via networked PC's with software that allows for control via stepping motors and data collection via counters. A networked printer is available. ICDD database, JADE diffraction analysis, CaRine crystal builder simulation and Laue diffraction software packages are available. SPEC and CPLOT are available on three of the stations.



The Materials Research Science and Engineering Center (MRSEC) is supported by the National Science Foundation under NSF Award Number DMR-0520513. Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect those of the National Science Foundation.
© 2007 Northwestern University